The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Nov. 02, 2022
Qcify Inc., San Mateo, CA (US);
Raf Peeters, San Mateo, CA (US);
Pieter Boogaerts, Sint-Katelijne-Waver, BE;
Jef De Busser, Geel, BE;
Antoon De Cleen, Diest, BE;
Simon Kerkhofs, Zonhoven, BE;
Pieter Ieven, Genk, BE;
Qcify Inc., San Mateo, CA (US);
Abstract
A process includes receiving a target quality value, receiving a measured quality value, and sending an inspection control instruction. The inspection control instruction is based at least in part on the target quality value and the measured quality value. The measured quality value is generated by a product inspector configured to inspect a sample before being sorted and may also include data generated by an output product inspector configured to inspect a sample after passing a sorting phase. The target quality value indicates a desired quality value of an output group of samples. The inspection control instruction controls the method of inspection performed by the product inspector. The measured quality values are received by a computing device, which in turn outputs the inspection control instruction to a product inspector.