The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Oct. 18, 2022
Keysight Technologies, Inc., Santa Rosa, CA (US);
Razvan Ionut Stan, Agoura Hills, CA (US);
Christian Paul Sommers, Bangor, CA (US);
Lyle Eugene Thompson, Mentone, CA (US);
Russil Wvong, Vancouver, CA;
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
Methods, systems, and computer readable media for testing a system under test (SUT). An example system includes a fabric emulation device configured for emulating a data center switching fabric using emulated switch queues and for emulating one or more congestion control mechanisms for network traffic on the data center switching fabric from the SUT. The system includes a test execution manager configured for: executing a test case causing the fabric emulation device to invoke at least a first congestion control mechanism; logging one or more metrics characterizing the first congestion control mechanism in response to invoking the first congestion control mechanism, wherein logging the one or more metrics comprises logging at least one performance metric from at least one emulated switch queue of the fabric emulation device; and outputting a test report based on logging the one or more metrics.