The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Oct. 23, 2023
Applicant:

Interdigital Patent Holdings, Inc., Wilmington, DE (US);

Inventors:

Pouriya Sadeghi, San Diego, CA (US);

Janet Stern-Berkowitz, Little Neck, NY (US);

Moon Il Lee, Melville, NY (US);

Assignee:

INTERDIGITAL PATENT HOLDINGS, INC., Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04L 1/1822 (2023.01); H04L 1/1867 (2023.01); H04L 5/14 (2006.01); H04W 72/0446 (2023.01); H04W 72/23 (2023.01);
U.S. Cl.
CPC ...
H04L 1/1887 (2013.01); H04L 1/1822 (2013.01); H04L 5/001 (2013.01); H04L 5/0055 (2013.01); H04L 5/0094 (2013.01); H04L 5/1469 (2013.01); H04W 72/0446 (2013.01); H04W 72/23 (2023.01);
Abstract

A method and apparatus for providing for full-duplex (FD) operation in time division duplex (TDD) communications are disclosed herein. A wireless transmit/receive unit (WTRU) may receive an indication of a first, UL heavy, TDD uplink (UL)/downlink (DL) configuration and an indication of a second, DL heavy, TDD UL/DL configuration. The WTRU may also receive a grant in a common DL subframe. The WTRU may apply the hybrid automatic repeat request (HARQ) process timing associated with one of the TDD UL/DL configurations for DL HARQ feedback. Also, the WTRU may monitor a set of subframes for a UL or a DL grant. Further, the WTRU may receive a grant in a subframe which may include an indication of a reference TDD UL/DL configuration. The WTRU may then apply the HARQ process timing associated with the reference TDD UL/DL configuration for DL HARQ feedback.


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