The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Oct. 20, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Masahito Tanaka, Kyoto, JP;

Hitoshi Fukuhara, Kyoto, JP;

Mamoru Egi, Kyoto, JP;

Yasushi Ono, Kyoto, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 13/08 (2006.01); G01K 13/00 (2021.01); G01R 27/02 (2006.01); G01R 31/34 (2020.01); H02P 29/64 (2016.01);
U.S. Cl.
CPC ...
H02P 29/64 (2016.02); G01K 13/00 (2013.01); G01R 27/02 (2013.01); G01R 31/343 (2013.01); G01K 13/08 (2013.01);
Abstract

A processing apparatus acquires a first rise transition that is a rise transition of the temperature of a winding and a second rise transition that is a rise transition of the temperature detected by a temperature sensor in a state where voltage application for raising the temperature of the winding to a predetermined temperature is performed, determines a predetermined temperature characteristic model by calculating a predetermined parameter on the basis of the second rise transition, and further determines a winding temperature characteristic model by calculating a winding related parameter on the basis of the first rise transition.


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