The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Mar. 28, 2022
Applicant:

The Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventors:

Fan Lam, Champaign, IL (US);

Jonathan V. Sweedler, Urbana, IL (US);

Yuxuan Xie, Champaign, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G06T 5/10 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G06T 5/10 (2013.01); G06T 5/50 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/20212 (2013.01);
Abstract

Methods, apparatus, and storage medium for obtaining high-resolution mass spectra and chemical maps from a sample using a subspace Fourier transform mass spectrometry (FT-MS) approach are described. The method includes conducting a first set of image data corresponding to a first group of spatial positions on the sample and a second set of image data corresponding to a second group of spatial positions on the sample; conducting a decomposition process on the first set of image data to obtain a set of basis elements; performing a reconstruction process on a second set of image data to obtain a set of reconstructed image data; performing a Fourier transform on the first and second sets of image data to obtain a first and second sets of mass spectra, respectively; and obtaining a FT-MS image for the sample based on the first set of mass spectra and the second set of mass spectra.


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