The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Oct. 20, 2020
Koninklijke Philips N.v., Eindhoven, NL;
André Gooßen, Radbruch, DE;
Axel Saalbach, Hamburg, DE;
Rafael Wiemker, Kisdorf, DE;
Tim Philipp Harder, Ahrensburg, DE;
Tom Brosch, Hamburg, DE;
Hrishikesh Narayanrao Deshpande, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A system for reviewing a prior medical image and a related prior medical report, including: a plurality of measurement tools configured to: receive an input medical image and information regarding a medical finding; analyze the input medical image to determine a measurement relating to the medical finding; and output the measurement relating to the medical finding; a report analyzer configured to: receive the prior medical report; analyze the prior medical report to extract first information regarding a first medical finding described in the medical report; select a first measurement tool of the plurality of measurement tools to analyze the prior medical image based upon the first extracted information; and output the first extracted information to the first measurement tool, wherein the first measurement tool analyzes the prior medical image to produce a first updated measurement of the first medical finding and the first measurement tool analyzes a new medical image associated with the prior medical image to produce a new first measurement of the first medical finding; a report generator configured to receive the new first measurement and to produce a new report based upon the new first measurement.