The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Sep. 13, 2022
Applicants:

Kenvue Brands Llc, Summit, NJ (US);

Inria (Institut National DE Recherche En Informatique ET En Automatique), Les Chesnay-Rocquencourt, FR;

Inventors:

Xavier Descombes, Sophia Antipolis, FR;

Imane Lboukili, Val de Reuil, FR;

Thierry Oddos, Clamart, FR;

Georgios N. Stamatas, Val de Reuil, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01);
Abstract

Methods for non-invasive or minimally invasive assessment of epithelial tissue structure are disclosed. Digital imaging and processing are used to identify cell locations. More specifically, an automated algorithm that may be used to identify epithelial tissue structure, and/or to specify the coordinates/locations of cells in the epithelial tissue structure, through non-invasive or minimally invasive imaging, and use of this information to extract values of epithelial structure related parameters are disclosed.


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