The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Jun. 30, 2022
Shenzhen Yinwang Intelligent Technologies Co., Ltd., Shenzhen, CN;
Yilun Chen, Shenzhen, CN;
Han Li, Shenzhen, CN;
SHENZHEN YINWANG INTELLIGENT TECHNOLOGIES CO., LTD., Shenzhen, CN;
Abstract
This application provides a parameter calibration method and apparatus, which may be applied to calibration of an intrinsic parameter and an extrinsic parameter of an image shooting device. According to the method and apparatus, with a position of a calibration pattern fixed, a position and an angle of the image shooting device relative to the calibration pattern are accurately adjusted by changing a pose parameter of the image shooting device, so that the image shooting device photographs the calibration pattern at each given position and angle relative to the calibration pattern, to obtain at least one shooting result. The shooting result can correspond to coordinate in a pixel coordinate system and a world coordinate system, so that accuracy of an intrinsic parameter and an extrinsic parameter is correspondingly calculated.