The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Feb. 17, 2020
Nec Corporation, Tokyo, JP;
Gaku Nakano, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A projection transformation parameter for guaranteeing a deformation to a convex quadrilateral can be calculated even when one or more of correspondence points are errors. A projection transformation parameter estimation device according to an embodiment includes a correspondence point detection unit () configured to detect information about a correspondence between two pieces of input data, a quadratic surface calculation unit () configured to fit a quadratic surface to the information about the correspondence for one or both of the two pieces of the input data, and a projection transformation matrix calculation unit () configured to calculate a projection transformation parameter between the two pieces of the input data by using the information about the correspondence with a constraint condition specifying that a property of the quadratic surface is maintained even after projection transformation.