The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Mar. 05, 2021
Basf SE, Ludwigshafen am Rhein, DE;
Aranzazu Bereciartua-Perez, Derio, ES;
Artzai Picon Ruiz, Derio, ES;
Corinna Maria Spangler, Ludwigshafen, DE;
Christian Klukas, Limburgerhof, DE;
Till Eggers, Ludwigshafen, DE;
Ramon Navarra-Mestre, Limburgerhof, DE;
Jone Echazarra Huguet, Derio, ES;
BASF SE, Ludwigshafen am Rhein, DE;
Abstract
In performing a computer-implemented method to quantify biotic damage in leaves of crop-plants, the computer receives a plant-image () showing a crop-plant, showing the aerial part of the plant, with stem, branches, and leaves and showing the ground on that the plant is placed. A segmenter module obtains a segmented plant-image being a contiguous set of pixels that shows in a contour (A) of the aerial part, the contour (A) having a margin region () that shows the ground partially. The computer uses convolutional neural network that processing the segmented plant-image by regression to obtain a damage degree, the convolutional neural network having been trained by processing damage-annotated segmented plant-images.