The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Sep. 06, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Takayuki Katsuki, Tokyo, JP;

Haoxiang Qiu, Tokyo, JP;

Tadanobu Inoue, Yokohama, JP;

Ryuki Tachibana, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/55 (2013.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/552 (2013.01); G06N 20/00 (2019.01);
Abstract

A computerized machine learning anomaly detection model trained on a plurality of samples of one or more source domains (optionally, one or more source domains and the target domain) is accessed. Using online deep sets, one or more domain vectors are computed for each target domain sample at an observation point, each target domain sample corresponding to a given target domain, where the one or more domain vectors represent a similarity and difference among the source and target domains. The target domain sample is processed using the anomaly detection model trained on the plurality of samples of the source to generate an anomaly score, the processing being based on the computed one or more domain vectors.


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