The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Feb. 16, 2023
Capital One Services, Llc, McLean, VA (US);
Galen Rafferty, Mahomet, IL (US);
Samuel Sharpe, Cambridge, MA (US);
Brian Barr, Schenectady, NY (US);
Jeremy Goodsitt, Champaign, IL (US);
Michael Davis, Arlington, VA (US);
Taylor Turner, Richmond, VA (US);
Justin Au-Yeung, Somerville, MA (US);
Owen Reinert, Queens, NY (US);
Capital One Services, LLC, McLean, VA (US);
Abstract
In some aspects, a computing system obtain a first dataset including a set of original data samples and a first set of spurious data samples. Based on a time period expiring, the computing system may replace the first set of spurious data samples in the first dataset with a second set of spurious data samples. The computing system may obtain an indication that a second dataset is available via a third-party computing device. Based on a determination that a subset of samples of the second dataset correspond to the first set of spurious data samples, the computing system may determine a time window in which an incident occurred. As an example, the time window may be determined to correspond to a time before the first set of spurious data samples were replaced with the second set of spurious data samples.