The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Aug. 07, 2023
Western Digital Technologies, Inc., San Jose, CA (US);
Eran Sharon, Rishon Lezion, IL;
Daniel J. Linnen, Naperville, IL (US);
James Tom, Los Altos, CA (US);
Nika Yanuka, Hadera, IL;
Tomer Eliash, Kfar Saba, IL;
Preston Thomson, Boise, ID (US);
Kirubakaran Periyannan, Santa Clara, CA (US);
Sandisk Technologies, Inc., Milpitas, CA (US);
Abstract
For bit errors caused by intrinsic cell variations, the bit errors are scattered across a page of memory. However, for bit errors caused by a physical issue in memory, the bit errors cluster together within the same memory area. In an example data storage device, a page of memory is divided into sections, and counters are used to count the number of errors in each section. A physical error location is detected if the number exceeds a parameter, and as compared to the number of errors in the other sections. In another example data storage device having an error correction code (ECC) engine, a histogram and binomial probability are used to detect physical errors. This has the advantage of detecting weak memory blocks that are about to fail, so the blocks can be retired early as a grown bad block.