The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Dec. 08, 2023
Applicant:

Korea Photonics Technology Institute, Gwangju, KR;

Inventors:

Seon Kyu Yoon, Gwangju, KR;

Ha Mong Shim, Gwangju, KR;

Jin Su Lee, Gwangju, KR;

Kwang Hoon Lee, Anyang-si, KR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/00 (2006.01); G01B 9/021 (2006.01); G01B 11/16 (2006.01); G03H 1/04 (2006.01); G03H 1/08 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0005 (2013.01); G01B 9/021 (2013.01); G01B 11/164 (2013.01); G03H 1/0402 (2013.01); G03H 1/0443 (2013.01); G03H 1/0866 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0415 (2013.01);
Abstract

According to an embodiment, a holographic microscope comprises a light source, an optical system splitting light emitted from the light source into an object and a reflective mirror and inducing interference between light reflected by the object or transmitted through the object and light reflected by the reflective mirror, a first image sensor receiving the interference light and sensing interference information for the interference light, a second image sensor receiving the light reflected by the object or transmitted through the object and sensing information for the received light, and an image processor deriving a shape of the object based on the interference information sensed by the first image sensor and the information sensed by the second image sensor.


Find Patent Forward Citations

Loading…