The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
May. 28, 2020
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Christian Schumann, Lich, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope is provided. The microscope includes a lens system comprising a lens unit, which is adjustable along an optical axis of the lens system to correct an imaging error. The microscope further includes a motor-actuatable adjustment device, which is configured to adjust the lens unit along the optical axis. The microscope also includes a processor and a scanning unit, which is configured to deflect a light beam used for the image recording. The processor is configured to compare a position of an image which has been recorded after a correction adjustment of the lens unit to reference data, detect a change of the position of the image due to the correction adjustment of the lens unit based on the comparison, and activate the scanning unit in such a way that the change of the position of the image is at least partially compensated for.