The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Mar. 07, 2022
Applicant:

Pacific Biosciences of California, Inc., Menlo Park, CA (US);

Inventors:

Windsor Owens, San Francisco, CA (US);

Bryan P. Staker, San Ramon, CA (US);

Robert Hartlage, Sunnyvale, CA (US);

Edvinas Zizminskas, Dublin, CA (US);

Paul Heilman, San Carlos, CA (US);

Jim Jahncke, San Ramon, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/26 (2006.01); G02B 27/58 (2006.01); G06T 3/4053 (2024.01); G06T 7/70 (2017.01); H04N 23/55 (2023.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G02B 21/0048 (2013.01); G02B 21/008 (2013.01); G02B 21/26 (2013.01); G02B 27/58 (2013.01); G06T 3/4053 (2013.01); G06T 7/70 (2017.01); H04N 23/55 (2023.01); H04N 23/56 (2023.01); G06T 2207/10056 (2013.01);
Abstract

Disclosed herein is a high throughput optical scanning system to generate super resolution images and methods of use. The optical scanning device and methods of use provided herein can allow high throughput scanning of a continuously moving object with a high resolution despite fluctuations in stage velocity. This can aid in high throughput scanning of a substrate, such as a biological chip comprising fluorophores. Also provided herein are improved optical relay systems and scanning optics.


Find Patent Forward Citations

Owens, Windsor. (2025). High speed scanning systems for super resolution imaging (U.S. Patent No. 12306390). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12306390

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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