The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Feb. 09, 2021
Omron Corporation, Kyoto, JP;
Kazuya Kimura, Kizugawa, JP;
Masayuki Hayakawa, Kizugawa, JP;
Hisayasu Morino, Fukuchiyama, JP;
Yusuke Nagasaki, Soraku-gun, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
In one or more embodiments of an optical interference measurement apparatus, first return light received by a first measurement head is guided to a detector via a first optical path and a fiber coupler. Second return light received by a second measurement head is guided to the detector via a second optical path and the fiber coupler. Optical path lengths Dand Dfrom the fiber coupler to a leading end of the first measurement head and a leading end of the second measurement head respectively, a maximum optical path length Rmax of the measurement range of the first measurement head, optical path lengths Sand Sof the first reference light that interferes with the first return light and of the second reference light that interferes with the second return light respectively are set such that the relation D+Rmax−S<D−Sis satisfied.