The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Apr. 19, 2023
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Dominik Paul, Bubenreuth, DE;

Mario Zeller, Erlangen, DE;

Flavio Carinci, Würzburg, DE;

Assignee:

Siemens Healthineers AG, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/54 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5617 (2013.01); G01R 33/543 (2013.01); G01R 33/5608 (2013.01);
Abstract

A method for avoiding artifacts in image data reconstructed from measurement data acquired by means of a TSE (turbo spin echo) sequence with a coil having a plurality of antenna elements associated with one channel respectively. The method includes loading the measurement data, acquired with the coil, of all channels of the coil; loading at least the first three echo signals respectively of an echo train from phase correction measurement data of all channels acquired with the coil in relation to the TSE sequence; determining a step value d for each channel of the coil from the loaded phase correction measurement data, which value describes a signal drop in the three successive echo signals of the phase correction measurement data; channel-by-channel manipulation of the measurement data as a function of the step value of the respective channel; and reconstructing image data by taking into account the manipulated measurement data.


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