The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Apr. 09, 2021
Applicant:

Auburn University, Auburn, AL (US);

Inventors:

Spencer Millican, Auburn, AL (US);

Yang Sun, Auburn, AL (US);

Soham Roy, Auburn, AL (US);

Vishwani D. Agrawal, Auburn, AL (US);

Assignee:

Auburn University, Auburn, AL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G06F 30/337 (2020.01); G06N 3/045 (2023.01); G06N 20/00 (2019.01); G06F 117/02 (2020.01);
U.S. Cl.
CPC ...
G01R 31/31835 (2013.01); G06F 30/337 (2020.01); G06N 3/045 (2023.01); G06N 20/00 (2019.01); G06F 2117/02 (2020.01);
Abstract

The methods and systems are directed to automated computer analysis and machine learning. Specifically, the systems and methods for using machine learning to generate fault prediction models and applying the fault prediction models to logical circuits to optimize test point insertion determinations and optimize fault detection in the logical circuit. Disclosed are methods and systems that that generates training data from training circuits (and optionally generate training circuits), trains a learning segment (which may include an artificial neural network (ANN)) using the training data. The learning segment (once trained) generates fault prediction models to predict the quality of a TP inserted on a given circuit location and optimize TPI for a given circuit. The methods and systems described provide computational (CPU/processing) time advantages and precision over conventional methods.


Find Patent Forward Citations

Loading…