The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Feb. 28, 2023
Huawei Technologies Co., Ltd., Guangdong, CN;
Yu Huang, Shenzhen, CN;
Changming Cui, Shenzhen, CN;
Junlin Huang, Shenzhen, CN;
Haitao Fu, Chengdu, CN;
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Abstract
A test circuit transmits input data of a test vector to a data distribution circuit using an input of a test bus, and transmits the input data of the test vector to a scan input channel in a circuit under test using the data distribution circuit. After scan of the circuit under test is completed, output data of the test vector on a scan output channel in the circuit under test is transmitted to an output of the test bus using the data distribution circuit, to complete testing of the circuit under test. A dynamic correspondence between the data distribution circuit and the test bus may be configured based on a specific test solution, so that a test resource can be dynamically allocated.