The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Nov. 10, 2021
Applicant:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Thomas Meyer, Walchwil, CH;

Anthony Sibler, Villmergen, CH;

Assignee:

ROCHE DIAGNOSTICS OPERATIONS, INC., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); B01L 2200/025 (2013.01); G01N 2035/0406 (2013.01); G01N 2035/0496 (2013.01);
Abstract

The present disclosure relates to a laboratory system to monitor reference points of laboratory devices. The laboratory system comprises a first laboratory device comprising a first reference point, a second laboratory device comprising a second reference point, and a coupling element. The coupling element couples the first reference point and the second reference point. The coupling element comprises a detectable part adapted to be moved between a starting position and at least one detection position when the relative position of the first reference point and the second reference point to each other changes. The laboratory system further comprises a sensor configured to detect the detectable part of the coupling element in the at least one detection position. In addition, a method of operating the laboratory system as described is disclosed.


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