The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Sep. 24, 2020
Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Kouichi Masutani, Kobe, JP;

Yuji Wakamiya, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); B01L 9/00 (2006.01); B01L 9/06 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); B01L 9/06 (2013.01); B01L 9/54 (2013.01); G01N 35/026 (2013.01); G01N 35/00732 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/0412 (2013.01); G01N 2035/0467 (2013.01);
Abstract

A sample measurement system according to an embodiment may include: sample measurement units that receive supply of containers and perform measurement on samples; a rack setting unit in which a rack storing the containers to be supplied to at least one of the sample measurement units is set; a first transport path that transports the containers from the rack setting unit to at least one of the sample measurement units; a second transport path that is provided at a position different from the first transport path in a height direction and that transports the containers from at least one of the sample measurement units to the rack setting unit; and a transfer path that transfers the containers between the first transport path and the second transport path.


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