The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Feb. 21, 2023
Hong Kong Applied Science and Technology Research Institute Company Limited, Hong Kong, CN;
Zheng Long Li, Hong Kong, CN;
Laifa Fang, Shenzhen, CN;
Abstract
The framework predicts water-quality data from observation data associated with raw features, e.g., rainfall. In the framework, an artificial neural network (ANN) computes the predicted water-quality data from feature data associated with impact features and derived from the observation data. The impact features are learnable, and are selected from impact-feature candidates comprising directional change- (DC-based) features each indicating occurrence of DC events in a corresponding raw feature. Including the DC-based features in the candidates enhances the ANN's ability of capturing significant change patterns of water quality due to extreme/unexpected events. The ANN architecture is also configurable according to model hyperparameters, which are learnable. The impact features and model hyperparameters are learnt by differential evolution for maximizing a prediction performance achieved by the ANN, thereby enabling the ANN architecture and impact features to be automatically optimized without requiring manual adjustment by domain experts in applying the ANN to different situations.