The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Sep. 25, 2024
Applicant:
Colin Irvin Wong, Burnaby, CA;
Inventor:
Colin Irvin Wong, Burnaby, CA;
Assignee:
HORIZONTAL PLANE CORPORATION, BURNABY, CA;
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); B64U 20/80 (2023.01); G01F 1/58 (2006.01); G01N 21/17 (2006.01); G01N 21/85 (2006.01); B64U 101/35 (2023.01);
U.S. Cl.
CPC ...
G01N 33/0019 (2024.05); B64U 20/80 (2023.01); G01F 1/58 (2013.01); G01N 21/17 (2013.01); G01N 21/85 (2013.01); B64U 2101/35 (2023.01); G01N 2021/1795 (2013.01); G01N 2021/8578 (2013.01);
Abstract
A method of determining a flow rate of airborne matter of a plume from an emission source through a notional surface. The method comprises obtaining a plurality of mass ratio measurements along a sampling surface and determining a mass flow rate of the airborne matter of the plume through at least a portion of the notional surface based at least in part on the plurality of mass ratio measurements, wherein the sampling surface and the notional surface are non-parallel.
Wong, Colin. (2025). Methods for measuring fugitive emission rates (U.S. Patent No. 12306159). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12306159
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