The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Apr. 20, 2018
Applicant:

Panasonic Corporation, Osaka, JP;

Inventors:

Yosuke Hanai, Osaka, JP;

Atsuo Nakao, Nara, JP;

Takeshi Yanagida, Fukuoka, JP;

Kazuki Nagashima, Fukuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 1/22 (2006.01); G01N 1/40 (2006.01); G01N 30/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0011 (2013.01); G01N 1/22 (2013.01); G01N 1/405 (2013.01); G01N 2030/008 (2013.01);
Abstract

A method for analyzing a gas includes: allowing a sample gas to be adsorbed by each of a plurality of adsorbents () respectively having compositions that are different from each other; allowing the sample gas to be desorbed individually from the adsorbents () while detecting individually the sample gas desorbed from each of the adsorbents () so as to acquire desorption profiles of the sample gas that are respectively unique to the adsorbents (); and identifying the sample gas by using a group of the desorption profiles. The acquiring of the desorption profiles is carried out by detecting, individually and over time, the sample gas desorbed from each of the adsorbents (). Each of the desorption profiles is, for example, an overtime data created from a detection signal reflecting a quantity of the sample gas.


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