The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Dec. 25, 2019
Shimadzu Corporation, Koyo, JP;
Satoru Watanabe, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A sample measurement device () includes a measurement unit () configured to measure a sample containing a plurality of components according to a measurement condition () including a plurality of parameters (), and a data processing unit () configured to acquire measurement data, and the data processing unit is configured to acquire a distribution () of a measurement quality indicator () according to the measurement condition based on the measurement data (), and identify a peak () of each of the components in the measurement data based on the distribution of the measurement quality indicator and the parameters used when the sample is measured.