The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Dec. 04, 2019
Applicant:

Waygate Technologies Usa, Lp, Houston, TX (US);

Inventors:

Weiwei Zhang, Bonn, DE;

Frank Kahmann, Aachen, DE;

Assignee:

Waygate Technologies USA, LP, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01N 29/0618 (2013.01); G01N 29/0609 (2013.01); G01N 29/265 (2013.01); G01N 2291/051 (2013.01); G01N 2291/101 (2013.01);
Abstract

Systems and methods are provided for generating a digital twin representation of an ultrasonic testing environment. In one aspect, probe position data received from one or more controllers and coordinate system data generated by one or more sensors can be used to generate a digital twin representation of an ultrasonic testing environment. In another aspect, generating the digital twin representation can include determining probe position measurements and a plurality of probe paths to be included in the digital twin representation. In one aspect the system can include a vision system to enable remote operation of the ultrasonic testing environment based on the generated digital twin representation.


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