The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Feb. 21, 2023
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Hiroko Miki, Kawasaki Kanagawa, JP;

Yoshiaki Sugizaki, Fujisawa Kanagawa, JP;

Hideyuki Tomizawa, Ota Gumma, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/44 (2013.01);
Abstract

A method for inspecting probe molecule includes evaluating the formation of the probe molecule at the surface of the graphene by comparing an intensity ratio a1/b1, and an intensity ratio a2/b2. The intensity a1 is of a peak of the first Raman spectrum having a peak top positioned in a first band of not less than 1200 cmand not more than 1500 cm. The intensity b1 is of a peak of the first Raman spectrum having a peak top positioned in a second band of not less than 1510 cmand not more than 1800 cm. The intensity a2 is of a peak of the second Raman spectrum having a peak top positioned in the first band. The intensity b2 is of a peak of the second Raman spectrum having a peak top positioned in the second band.


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