The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Dec. 04, 2020
Applicant:
Vieworks Co., Ltd., Anyang-si, KR;
Inventors:
Young Ho Kim, Seoul, KR;
Yu Jung Kang, Anyang-si, KR;
Assignee:
VIEWORKS CO., LTD., Anyang-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/6869 (2018.01); B01L 3/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6428 (2013.01); B01L 3/502784 (2013.01); C12Q 1/6869 (2013.01); G01N 21/6486 (2013.01); G01N 2021/6463 (2013.01); G01N 2201/02 (2013.01); G01N 2201/063 (2013.01);
Abstract
Disclosed are a successive optical analysis system for optically analyzing a flow cell, including: at least one stage on which the flow cell is loaded; at least two optical analyzing units configured to optically analyze the flow cell loaded on the stage; and a conveying unit configured to convey at least one of the stage and the optical analyzing unit and align positions of the stage and the optical analyzing unit, and a successive optical analysis method using the same.