The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Feb. 21, 2023
GM Global Technology Operations Llc, Detroit, MI (US);
Gui Chen, Sterling Heights, MI (US);
Bo Yu, Troy, MI (US);
Brent Navin Roger Bacchus, Sterling Heights, MI (US);
Shu Chen, Rochester Hills, MI (US);
Joon Hwang, Pflugerville, TX (US);
Michael Alan Losh, Rochester Hills, MI (US);
GM GLOBAL TECHNOLOGY OPERATIONS LLC, Detroit, MI (US);
Abstract
A method for quantifying map errors includes receiving first map data and second map data. The method includes receiving a road topographic map. The method further includes dividing the road into road segments. The method further includes creating a plurality of bounding boxes for each of the plurality of road segments. The method includes creating a first map tile and a second map tile by filtering out the bounding boxes. The method includes executing point cloud registration to align the plurality of first data points in the first map tile with the plurality of second data points in the second map tile to determine a plurality of absolute offsets between the plurality of first data points and the plurality of second data points. The method includes determining a relative map error between the first map and the second map based on the absolute offsets.