The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Oct. 20, 2022
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

Takeshi Kikuchi, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01W 1/10 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G01C 15/00 (2013.01); G01W 1/10 (2013.01); G06F 11/0706 (2013.01);
Abstract

Provided is an error prediction apparatus including at least one processor and at least one memory configured to receive environment data of a surveying site in which a surveying instrument is installed, to input the environment data of the surveying site into an error prediction model and predict a predicted error that occurs in a surveying result obtained by the surveying instrument under an environment of the surveying site, and to create display data for displaying the predicted error when the predicted error exceeds an allowable value. The error prediction model is a learned model created by machine learning for a surveying instrument of the same model as the surveying instrument by using a set of the environment data indicating an environment of the time of surveying and error data in a surveying result as teacher data.


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