The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Nov. 07, 2022
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Joshua Monroe Cobb, Victor, NY (US);

Steven James Van Kerkhove, Webster, NY (US);

Assignee:

CORNING INCORPORATED, Corning, NY (US);

Primary Examiner:
Int. Cl.
CPC ...
G01B 9/0209 (2022.01); G01B 9/02 (2022.01); G01B 11/24 (2006.01); G01B 11/30 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G01B 9/0209 (2013.01); G01B 9/02041 (2013.01); G01B 11/2441 (2013.01); G01B 11/30 (2013.01); G02B 27/1006 (2013.01);
Abstract

A low-coherence Fizeau interferometer includes a first beamsplitter, a test arm and a reference arm, the first beamsplitter splits light into a first portion of light directed to the test arm and a second portion of light directed to the reference arm, and an imaging arm comprising a first collimating lens, a flat reference surface, and a test element. The test arm focuses the first portion of light at a first focal point, such that a virtual image of the first focal point appears at a focal point of the test element. The reference arm focuses the second portion of light at a second focal point, the first collimating lens collimates the light that then reflects off the flat reference surface. The second beamsplitter directs the first portion of light to reflect off the test element. The reflection of the first and second portion of light form an interference pattern.


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