The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Jun. 04, 2021
Sumitomo Electric Industries, Ltd., Osaka, JP;
Cyfuse Biomedical K.k., Tokyo, JP;
National University Corporation Tokai National Higher Education and Research System, Nagoya, JP;
Asako Motomura, Osaka, JP;
Yoko Sugiyama, Osaka, JP;
Hiroshi Suganuma, Osaka, JP;
Akinori Kimura, Osaka, JP;
Shizuka Akieda, Tokyo, JP;
Yudai Miyazaki, Tokyo, JP;
Ryuji Kato, Nagoya, JP;
Mayu Shibuta, Nagoya, JP;
Ryohei Yamamoto, Nagoya, JP;
Sumitomo Electric Industries, Ltd., Osaka, JP;
Cyfuse Biomedical K.K., Tokyo, JP;
National University Corporation Tokai National Higher Education and Research System, Nagoya, JP;
Abstract
A method for quality evaluation includes emitting measurement light having a wavelength of 300 nm or more and 2,000 nm or less to a cell mass and acquiring a plurality of light intensity information corresponding to each of a plurality of measuring positions in the cell mass, generating a feature amount from a variation of the acquired plurality of light intensity information, and evaluating quality of the cell mass using the generated feature amount as an index.