The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Apr. 26, 2024
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Takuma Kawamoto, Kanagawa, JP;

Misato Sasada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/10 (2006.01); B41M 7/00 (2006.01); C09D 11/101 (2014.01); C09D 11/38 (2014.01); C09K 19/38 (2006.01);
U.S. Cl.
CPC ...
C09D 11/101 (2013.01); B41M 7/0081 (2013.01); C09D 11/38 (2013.01); C09K 19/3852 (2013.01);
Abstract

Provided are an image recorded material including a substrate and an image recorded on the substrate, in which the image includes a cholesteric liquid crystal layer, the cholesteric liquid crystal layer has a stripe pattern of a bright portion and a dark portion, observed by a scanning electron microscope, in a cross section along a thickness direction of the image, in a case where an angle between a continuous line which is the bright portion or the dark portion and a main surface of the substrate is defined as an alignment angle, at least two regions in which an absolute value of a difference of the alignment angles is 5° or more are provided, and both of the two regions have a length of width of 1 mm or more in an in-plane direction of the substrate; and applications thereof.


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