The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

May. 06, 2021
Applicant:

Toyota Research Institute, Inc., Los Altos, CA (US);

Inventors:

Alexander Alspach, Somerville, MA (US);

Naveen Suresh Kuppuswamy, Arlington, MA (US);

Assignee:

Toyota Research Institute, Inc., Los Altos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G01B 11/22 (2006.01); G01L 9/00 (2006.01); G01L 27/00 (2006.01); G06F 18/22 (2023.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01); G06T 7/70 (2017.01); G06F 18/24 (2023.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); G01B 11/22 (2013.01); G01L 9/0077 (2013.01); G01L 27/002 (2013.01); G06F 18/22 (2023.01); G06T 7/0002 (2013.01); G06T 7/60 (2013.01); G06T 7/70 (2017.01); G06F 18/24 (2023.01); G06T 2207/10028 (2013.01);
Abstract

Systems and methods for calibrating deformable sensors are disclosed. In one embodiment, a method of calibrating a deformable sensor includes capturing image data of the deformable sensor using an external image sensor, wherein the deformable sensor comprises a deformable membrane defining an enclosure that is configured to be filled with a medium. The method further includes comparing the image data of the deformable sensor to a metric. When the image data does not satisfy the metric, the method includes adjusting a pressure within the enclosure.


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