The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Dec. 16, 2022
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Yongxiang Fan, Palo Alto, CA (US);

Tetsuaki Kato, Fremont, CA (US);

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B25J 19/00 (2006.01); B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 19/007 (2013.01); B25J 9/1612 (2013.01); B25J 9/163 (2013.01); B25J 9/1671 (2013.01);
Abstract

An automated technique for robot gripper fingertip design. A workpiece design and a bin shape are provided as inputs, along with a parameterized gripper design. The gripper parameters define the lengths of segments of the fingertips, and the bend angle between fingertip segments. A fingertip shape, defined by selecting parameter values, is used in a simulated picking of parts from many different randomly defined piles of workpieces in the bin. Grasps for the simulated bin picking are pre-defined and provided as input. A score is assigned to the particular fingertip shape based on the average number of leftovers from the many simulated bin picking operations. A new fingertip shape is then defined by selecting new values for the parameters, and the simulations are repeated to assign a score for the new fingertip shape. This process is repeated to suitably sample the parameter range, and a best-performing fingertip shape is identified.


Find Patent Forward Citations

Loading…