The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
May. 05, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Sebastian Simmer, Bischoffen, DE;
Stefan Christ, Schoeffengrund, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
The present invention relates to a microscopic examination device comprising a microscope and a sample preparation arrangement for preparing one or more samples to be examined in said microscope, said preparing including pipetting one or more liquids into one or more sample receptacles for said one or more samples, said sample preparation arrangement comprising a base and a receiving structure adapted to receive said one or more sample receptacles, said sample preparation arrangement further comprising a pipetting guide movably fixed or fixable in relation to the receiving structure, said pipetting guide comprising one or more pipette guiding structures positionable in relation to said one or more sample receptacles by pivoting said pipetting guide in relation to said base. A method of preparing one or more samples for microscopic examination is also part of the present invention.