The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Jun. 10, 2021
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventor:
Stefan Christ, Schoeffengrund, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502 (2013.01); B01L 2200/16 (2013.01); B01L 2300/042 (2013.01); B01L 2300/1822 (2013.01); B01L 2300/1894 (2013.01);
Abstract
A microscope for microscopic examination of a sample includes: a microscope housing enclosing an illumination optics, a microscope stage, and an imaging optics; an integrated sample chamber located within the microscope housing; and an integrated reagent chamber located within the microscope housing, the integrated reagent chamber supplying a reagent to the sample.