The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Jun. 19, 2020
Zivid As, Oslo, NO;
Øystein Skotheim, Oslo, NO;
Henrik Schumann-Olsen, Oslo, NO;
Alexey Stepanov, Oslo, NO;
Øyvind Janbu, Oslo, NO;
Martin Ingvaldsen, Oslo, NO;
Jens T. Thielemann, Oslo, NO;
Zivid AS, Oslo, NO;
Abstract
A method for determining one or more groups of exposure settings to use in a 3D image acquisition process carried out with an imaging system, the 3D image acquisition process comprising capturing one or more sets of image data on the image sensor using the respective groups of exposure settings, wherein the one or more sets of image data are such as to allow the generation of one or more 3D point clouds defining the three-dimensional coordinates of points on the surface(s) of one or more objects being imaged, each group of exposure settings specifying a value for one or more parameters of the imaging system, wherein the method comprises identifying one or more candidate groups of exposure settings and selecting from the candidate groups of exposure settings, one or more groups of exposure settings that satisfy one or more optimization criteria.