The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Aug. 23, 2023
Applicant:
Jabil Inc., St. Petersburg, FL (US);
Inventor:
Girish S. Wable, St. Petersburg, FL (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H04N 23/57 (2023.01); H04N 25/70 (2023.01); H10F 39/00 (2025.01);
U.S. Cl.
CPC ...
H01L 22/20 (2013.01); H04N 23/57 (2023.01); H04N 25/70 (2023.01); H10F 39/024 (2025.01); H10F 39/804 (2025.01); H10F 39/806 (2025.01);
Abstract
An apparatus, system and method are disclosed for a manufactured imager system. The apparatus, system and method may include an imager comprising a plurality of photosites divisible into a plurality of subsections, and at least one wafer-level lens additively composed of a plurality of material layers successively deposited directly upon the imager to achieve a predetermined optical performance for each of the plurality of subsections. The material layers may comprise one or more of a photopolymer, a thermoplastic resin, a low temperature melting glass, and a glass sheet, and may be uniform or non-uniform.