The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Jan. 27, 2022
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Nagma Samreen Khan, Tokyo, JP;

Kazumine Ogura, Tokyo, JP;

Masayuki Ariyoshi, Tokyo, JP;

Eric Cosatto, Princeton, NJ (US);

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/10 (2017.01); G06V 20/50 (2022.01);
U.S. Cl.
CPC ...
G06V 20/50 (2022.01); G06T 7/10 (2017.01); G06T 2200/04 (2013.01); G06T 2207/10044 (2013.01); G06T 2207/20081 (2013.01);
Abstract

A peak label object detection system (PLODS) includes an object size database configured to store information related to object size for a plurality of objects. The PLODS further includes a three-dimensional (3D) sensor database configured to store information related to parameters of a 3D sensor. The PLODS further includes an annotation database configured to store ground truth annotation information for images. The PLODS further includes a peak shape parameter calculator configured to determine a peak label size based on object size from the object size database and the parameters of the 3D sensor. The PLODS further includes a label generator configured to generate a peak labels map based on label size and the ground truth annotation information.


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