The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Aug. 12, 2024
Applicant:

Zomedica Inc., Ann Arbor, MI (US);

Inventors:

William Eugene Campbell, Marietta, GA (US);

Negin Ghassemian, Smyrna, GA (US);

Assignee:

Zomedica Inc., Ann Arbor, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G02B 21/26 (2013.01); G02B 21/365 (2013.01); G06T 2207/10056 (2013.01);
Abstract

Various examples of systems and methods are provided for imaging calibration for slide processing. In one example, among others, a system for processing microscope slides includes a light source; an imaging device comprising a lens; and a slide positioner that can position the ground-glass portion of a slide between the light source and lens. Processing circuitry of the system can acquire an image of at least a section of the ground-glass portion at an initial position; analyze contrast of adjacent pixels with respect to a defined contrast characteristic; iteratively advance the lens and acquire additional images based upon analysis of contrast of adjacent pixels with respect to the defined contrast characteristic; and identify an optimal focal location of the lens based upon the defined contrast characteristic. Subsequent image acquisition via the lens can be based at least in part upon the optimal focal location.


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