The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Feb. 08, 2022
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Enrico C. Quintana, Albuquerque, NM (US);
Elizabeth M. C. Jones, Cedar Crest, NM (US);
Daniel Peter Rohe, Albuquerque, NM (US);
Bryan Lee Witt, Albuquerque, NM (US);
Timothy J. Miller, Albuquerque, NM (US);
Phillip L. Reu, Albuquerque, NM (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
A method of X-ray digital image correlation is provided. The method comprises aligning cameras of an X-ray imaging system, wherein the X-ray imaging system comprises two X-ray sources pointed at a target area at a stereo angle and two corresponding X-ray detectors behind the target area. The X-ray imaging system is tuned to determine power levels of the X-ray sources that maximize image contrast and signal-to-noise ratio. The system is calibrated to determine intrinsic and extrinsic stereoscopic imaging parameters. A specimen with a random contrast pattern comprising an X-ray attenuating material is placed in the target area. Stereoscopic X-ray images are taken of the specimen and processed according to the power levels of the X-ray sources to maximize image contrast and signal-to-noise ratio and remove background objects. Kinematic quantities are determined according to changes in the contrast pattern over a number of successive images.