The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Dec. 09, 2021
Amazon Technologies, Inc., Reno, NV (US);
Ali Takbiriborujeni, Lynnwood, WA (US);
Mehdi Eftekhari Far, Issaquah, WA (US);
Mahesh Viswanathan, White Plains, NY (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
Images classified as including defects can be analyzed using localized anomaly detection to determine which regions of the images contributed to the classification. These techniques may identify one or more regions of the images having a confidence value exceeding a threshold or range as a factor in the classification. Using a number of different localized anomaly detection techniques may enable aggregation of the results to determine regions that overlap between the different techniques, thereby providing a higher confidence that these regions include defects. Such an approach can not only identify whether a defect is present, but also identify locations, sizes, or types of defects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile