The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Dec. 06, 2022
Oracle International Corporation, Redwood Shores, CA (US);
Yasha Pushak, Vancouver, CA;
Constantin Le Clei, Zurich, CH;
Fatjon Zogaj, Zurich, CH;
Hesam Fathi Moghadam, Sunnyvale, CA (US);
Sungpack Hong, Palo Alto, CA (US);
Hassan Chafi, San Mateo, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
In a computer, each of multiple anomaly detectors infers an anomaly score for each of many tuples. For each tuple, a synthetic label is generated that indicates for each anomaly detector: the anomaly detector, the anomaly score inferred by the anomaly detector for the tuple and, for each of multiple contamination factors, the contamination factor and, based on the contamination factor, a binary class of the anomaly score. For each particular anomaly detector excluding a best anomaly detector, a similarity score is measured for each contamination factor. The similarity score indicates how similar, between the particular anomaly detector and the best anomaly detector, are the binary classes of labels with that contamination factor. For each contamination factor, a combined similarity score is calculated based on the similarity scores for the contamination factor. Based on a contamination factor that has the highest combined similarity score, the computer detects that an additional anomaly detector is inaccurate.