The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

May. 22, 2019
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Sathya Arun, Fremont, CA (US);

Nirmal Mani, Sunnyvale, CA (US);

Ashok Pancily Poothiyot, San Jose, CA (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 3/0482 (2013.01); G06F 9/54 (2006.01); G06F 18/21 (2023.01); G06F 18/40 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 3/0482 (2013.01); G06F 9/541 (2013.01); G06F 18/2178 (2023.01); G06F 18/40 (2023.01); G06F 2218/12 (2023.01);
Abstract

Methods and systems are provided for evaluating providing insight into complex machine learning models to facilitate optimization of the models at scale. In particular, a system can guide and/or implement model training and evaluation in various machine learning environments. Further, the system is capable of using standardized evaluation metrics to provide insight into the success of iterations of a machine learning model. Additionally, the system allows for presenting visualizations based on such evaluation metrics to facilitate gaining insight into one or more machine learning models and/or instances of a machine learning model.


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