The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Jun. 28, 2022
Applicant:

Hcl America Inc., Sunnyvale, CA (US);

Inventors:

Manickam Muthiah, Shrewsbury, MA (US);

Razi Abdul Rahim, Willowbrook, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/33 (2020.01); G06F 30/3308 (2020.01); G06F 113/18 (2020.01); G06F 115/02 (2020.01); G06F 119/02 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3308 (2020.01); G06F 2113/18 (2020.01); G06F 2115/02 (2020.01); G06F 2119/02 (2020.01);
Abstract

This disclosure relates to system and method for generating an encapsulated error signature during functional simulation. The method includes receiving at least one error descriptor notification message from at least one of a plurality of testbench components. Each of the at least one error descriptor notification message includes values corresponding to a plurality of error attributes including error ranking, error code, error message, and error score. The method further includes iteratively updating in real-time, a plurality of arrays based on values corresponding to one or more of the plurality of error attributes, in response to receiving each of the at least one error descriptor notification message. The method further includes iteratively generating in real-time, an encapsulated error signature based on each of the error ranking, the error code, and an error count associated with the error code derived from one or more of the plurality of arrays.


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