The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Sep. 07, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Akihiro Yamaguchi, Kita Tokyo, JP;

Ken Ueno, Tachikawa Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06F 18/214 (2023.01); G06F 2218/02 (2023.01); G06F 2218/10 (2023.01); G06F 2218/20 (2023.01);
Abstract

One embodiment of the present provides an apparatus and the like that uses a model that estimates shapelet deformation which is according to variations in an anticipated factor, and thereby suppresses a drop in classification performance even if the circumstances of the anticipated factor are different between training and testing. An information processing apparatus according to one embodiment of the present invention is provided with an adjuster and a feature calculator. The adjuster adjusts the shape of a reference waveform pattern corresponding to time series data and used to classify the time series data, on the basis of the value of a factor parameter corresponding to the time series data. The feature calculator calculates a feature of a waveform of the time series data on a basis of the shape of the reference waveform pattern after the adjustment.


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