The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Apr. 08, 2022
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Alexander Hoole, Vancouver, CA;

James Wesley Rabon, Montgomery, AL (US);

Peter Thomas Blay, Santa Clara, CA (US);

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/3668 (2025.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3696 (2013.01); G06N 3/08 (2013.01);
Abstract

Systems and methods are disclosed for configuring a testing device to only perform relevant tests, wherein the test results are more meaningful (e.g., few false-positives) and relevant to the application. Source code is analyzed to determine elements that indicate a particular environment for the source code's corresponding machine code. When the source code indicates that a particular environment is not a candidate for execution of the machine code, tests associated with that particular environment are excluded. The testing device is then configured to perform those tests that are relevant for those environments that actually apply.


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