The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Aug. 30, 2022
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Takeshi Sakoda, Tokyo, JP;

Yumiko Sakai, Fujisawa Kanagawa, JP;

Tomonori Maegawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01);
Abstract

According to an embodiment, a generation device includes an analysis unit, a test scenario generation unit, and a test code generation unit. The analysis unit is configured to analyze a definition file that defines a structure of web application programming interface (Web API) and generate structure analysis data of the Web API. The test scenario generation unit is configured to generate test scenario data of the Web API from a test setting file and the structure analysis data. The test setting file including a test type of the Web API and a test item depending on the test type. The test code generation unit is configured to generate test code for testing the Web API based on the test scenario data.


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